The Swiss Society for Optics and Microscopy (SSOM/SGOEM/SSOME) was founded in 1949 as the Swiss Committee for Optics. Since 1969 it has existed in its present form uniting Swiss government and national research and technology interests in optics and electron microscopy in one organization. You can learn more about the history of the Swiss Society for Optics and Microscopy and the exciting beginning of Swiss electron microscopy from the book History of Electron Microscopy in Switzerland, edited by John R. Günther, Birkhäuser Verlag, Basel, 1990.
The SGOEM represents Swiss optics and electron microscopy activities
in national and international organizations.
The SGOEM's primary mission is to cultivate contacts between academic and
industrial workers, scientists, and researchers in the field, as well as laymen interested in optics
and electron microscopy.
The SGOEM furthers the exchange of scientific information, technology, and experience with international
organizations by disseminating information and by financially supporting
members in participating in international conferences.
The SGOEM is a member of the Schweizerische Akademie der Naturwissenschaften (SANW) and the Schweizerische Akademie der Technischen Wissenschaften (SATW).
The Society is also a member of the International Committee for Optics (ICO), the International Federation of Societies for Electron Microscopy (IFSEM), the European Optical Committee (EOC), the Committee of European Societies for Electron Microscopy (CESEM), the International Committee on the Science of Photography (ICSP), and the European Optical Society (EOS).
At the beginning of 1997 the Society had approximately 570 individual and 70 corporate members. Approximately 45% of our members are from trade and industry, 40% are from academia, and 15% are from research institutes.
The SGOEM is governed by a board with committee members from the technology industry and universities. The president is supported by a treasurer and the bulletin editor. The Society consists of an optics section and an electron microscopy section, each with its own secretary.